Share Email Print
cover

Proceedings Paper

The omni-directional image assisted optical surveillance system
Author(s): Yung-Hsiang Chen; Chi-Hung Hwang; Wei-Chung Wang; Chun-Fu Lin
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper presents a high resolution optical surveillance system which integrated an omni-directional imager as an event finder/ system trigger. The omni-directional optics, a fish-eye camera in this study, provides a wider field of view (FOV) which can monitor widely range continuously without scanning mechanism but offers sufficient information which includes sign of field event and direction and then drive high resolution surveillance camera for detail imaging. To archive an optical triggering surveillance system, the scale-invariant feature transform (SIFT) is implemented to detect features both from images taken by omni-directional imager and the high resolution surveillance camera. Considering the FOV of high resolution surveillance system is narrow, to ensure the pointing of high resolution surveillance system, feature matching is also implemented in this system to identify the images obtained by high resolution surveillance system are identical to the existing omni-directional image obtained from fish-eye camera. This provides a robust and accurate solution to the problem of optical radar surveillance system localization in unknown environments. An experiment is performed on outdoor image sequences with demonstrating the efficiency of our algorithm.

Paper Details

Date Published: 14 May 2015
PDF: 8 pages
Proc. SPIE 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV, 94890O (14 May 2015); doi: 10.1117/12.2176557
Show Author Affiliations
Yung-Hsiang Chen, National Applied Research Labs. (Taiwan)
National Tsing Hua Univ. (Taiwan)
Chi-Hung Hwang, National Applied Research Labs. (Taiwan)
Wei-Chung Wang, National Tsing Hua Univ. (Taiwan)
Chun-Fu Lin, National Applied Research Labs. (Taiwan)


Published in SPIE Proceedings Vol. 9489:
Dimensional Optical Metrology and Inspection for Practical Applications IV
Kevin G. Harding; Toru Yoshizawa, Editor(s)

© SPIE. Terms of Use
Back to Top