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Proceedings Paper

Standoff trace detection of explosives with infrared hyperspectral imagery
Author(s): F. Fuchs; S. Hugger; J.-P. Jarvis; Q. K. Yang; F. Zaum; R. Ostendorf; Ch. Schilling; W. Bronner; R. Driad; R. Aidam; J. Wagner
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Paper Abstract

In this work we present a hyperspectral image sensor based on MIR-laser backscattering spectroscopy for contactless detection of explosive substance traces. The spectroscopy system comprises a tunable Quantum Cascade Laser (QCL) with a tuning range of 7.5 μm to 9.5 μm as an illumination source and a high performance MCT camera for collecting the backscattered light. The resulting measurement data forms a hyperspectral image, where each pixel vector contains the backscattering spectrum of a specific location in the scene. The hyperspectral image data is analyzed for traces of target substances using a state of the art target detection algorithm (the Adaptive Matched Subspace Detector) together with an appropriate background extraction method. The technique is eye-safe and allows imaging detection of a large variety of explosive substances including PETN, RDX, TNT and Ammonium Nitrate. For short stand-off detection distances (<3 m), residues of explosives at an amount of just a few 10 μg, i.e. traces corresponding to a single fingerprint, could be detected. For larger concentration of explosives, stand-off detection over distances of up to 20 m has already been demonstrated.

Paper Details

Date Published: 22 May 2015
PDF: 10 pages
Proc. SPIE 9467, Micro- and Nanotechnology Sensors, Systems, and Applications VII, 94672O (22 May 2015); doi: 10.1117/12.2176361
Show Author Affiliations
F. Fuchs, Fraunhofer Institute for Applied Solid State Physics IAF (Germany)
S. Hugger, Fraunhofer Institute for Applied Solid State Physics IAF (Germany)
J.-P. Jarvis, Fraunhofer Institute for Applied Solid State Physics IAF (Germany)
Q. K. Yang, Fraunhofer Institute for Applied Solid State Physics IAF (Germany)
F. Zaum, Fraunhofer Institute for Applied Solid State Physics IAF (Germany)
R. Ostendorf, Fraunhofer Institute for Applied Solid State Physics IAF (Germany)
Ch. Schilling, Fraunhofer Institute for Applied Solid State Physics IAF (Germany)
W. Bronner, Fraunhofer Institute for Applied Solid State Physics IAF (Germany)
R. Driad, Fraunhofer Institute for Applied Solid State Physics IAF (Germany)
R. Aidam, Fraunhofer Institute for Applied Solid State Physics IAF (Germany)
J. Wagner, Fraunhofer Institute for Applied Solid State Physics IAF (Germany)


Published in SPIE Proceedings Vol. 9467:
Micro- and Nanotechnology Sensors, Systems, and Applications VII
Thomas George; Achyut K. Dutta; M. Saif Islam, Editor(s)

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