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Proceedings Paper

A new suspension structure of micro/nano probe
Author(s): Yong Li; Shuai Wang; ZhaoRui Chu; Jie Tang; Yang Xu; ZhuJun Ai; HongTao Wang
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Paper Abstract

The measuring force of a micro/nano probe is an important factor affecting the probe measurement accuracy. The strength of the force largely depends on the nature of the suspension structure. How to improve the flexibility of the suspension structure is a difficult issue. To tackle the problem, this paper will put forwards an integrated suspension structure, which composed of three evenly spaced elastic hinges. Each elastic hinge has two beams, one of which is used to as the support. In measurement, the maximum displacement is occurred at the intersection of the two beams. In this paper, the flexibility of the suspension structure and probe measuring capability related to the elastic hinge's size and material are investigated based on theoretical modeling and simulation. The research result is significant to reduce the probe measuring force and improve its sensitivity.

Paper Details

Date Published: 6 March 2015
PDF: 6 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94460N (6 March 2015); doi: 10.1117/12.2176017
Show Author Affiliations
Yong Li, Hefei Univ. of Technology (China)
Shuai Wang, Hefei Univ. of Technology (China)
ZhaoRui Chu, Hefei Univ. of Technology (China)
Jie Tang, Hefei Univ. of Technology (China)
Yang Xu, Hefei Univ. of Technology (China)
ZhuJun Ai, Hefei Univ. of Technology (China)
HongTao Wang, Hefei Univ. of Technology (China)


Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)

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