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Proceedings Paper

Bare PCB test method based on AI
Author(s): Aihua Li; Huiyang Zhou; Nianhong Wan; Liangsheng Qu
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Paper Abstract

The shortcomings of conventional methods used for developing test sets on current automated printed circuit board (PCB) test machines consist of overlooking the information from CAD, historical test data, and the experts' knowledge. Thus, the generated test sets and proposed test sequence may be sub-optimal and inefficient. This paper presents a weighting bare PCB test method based on analysis and utilization of the CAD information. AI technique is applied for faults statistics and faults identification. Also, the generation of test sets and the planning of test procedure are discussed. A faster and more efficient test system is achieved.

Paper Details

Date Published: 28 August 1995
PDF: 6 pages
Proc. SPIE 2620, International Conference on Intelligent Manufacturing, (28 August 1995); doi: 10.1117/12.217547
Show Author Affiliations
Aihua Li, Xi'an Jiaotong Univ. (China)
Huiyang Zhou, Xi'an Jiaotong Univ. (China)
Nianhong Wan, Xi'an Jiaotong Univ. (China)
Liangsheng Qu, Xi'an Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 2620:
International Conference on Intelligent Manufacturing

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