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Proceedings Paper

Modeling second-generation thermal imaging systems
Author(s): Howard V. Kennedy
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Paper Abstract

Analytical models of thermal imaging system performance have gradually become obsolete as TIS (thermal imaging systems) have become more complex and have improved in vertical performance. In particular, the effects of sampling and aliasing have not been included directly, but have had to be accounted for by side calculations before entering the data. In this paper, an approach to modeling second generation TIS is described in which the effects of sampling on both signal and noise are accounted for without requiring the user to make subsidiary calculations. The model is two-dimensional, using both vertical and horizontal resolution in the prediction of recognition and detection performance. A model for human perception is presented which differs slightly from the matched filter concept models and gives a closer match to measured data. The differences between modeling scanning and staring systems is discussed, as well as between systems with on-focal- rather than off-focal-plane sampling. Proper treatment of the several sources of noise in sampled systems is analyzed, including aliased noise.

Paper Details

Date Published: 1 October 1990
PDF: 15 pages
Proc. SPIE 1309, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing, (1 October 1990); doi: 10.1117/12.21753
Show Author Affiliations
Howard V. Kennedy, Texas Instruments, Inc. (United States)


Published in SPIE Proceedings Vol. 1309:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing

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