Share Email Print
cover

Proceedings Paper

Parallelism of fault diagnosis for large-scale mechatronic systems
Author(s): Junqi Li; Tielin Shi; Xue-Chuan Wang; Shuzi Yang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Real-time fault diagnosis for large-scale mechatronic systems is a fairly complex problem and has not been solved up to now. Parallel processing and distributed artificial intelligence (DAI), as rapidly emerging and promising technologies, provide powerful tools for solving this hard problem. Based on the study of basic fault diagnosis process for large-scale mechatronic systems, the idea of parallel processing and DAI is introduced into the fault diagnosing field. The parallelism at four different levels in the fault diagnosis process is proposed. It lays down the theoretical basis for the development of the real-time parallel distributed fault diagnosing system.

Paper Details

Date Published: 28 August 1995
PDF: 6 pages
Proc. SPIE 2620, International Conference on Intelligent Manufacturing, (28 August 1995); doi: 10.1117/12.217515
Show Author Affiliations
Junqi Li, Huazhong Univ. of Science and Technology (China)
Tielin Shi, Huazhong Univ. of Science and Technology (China)
Xue-Chuan Wang, Huazhong Univ. of Science and Technology (China)
Shuzi Yang, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 2620:
International Conference on Intelligent Manufacturing
Shuzi Yang; Ji Zhou; Cheng-Gang Li, Editor(s)

© SPIE. Terms of Use
Back to Top