Share Email Print

Proceedings Paper

Fault-tolerant byte organized semiconductor memory subsystems based on error-correcting codes
Author(s): Bingrong Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An effective means of designing a fault-tolerant semiconductor memory subsystem using error-correcting codes is obtained. One such code is the 1-UbEC code, the other is the 2B- UbEC code which is used to correct two unidirectional burst bytes errors. Finally, as an example of the application, the on-chip realization of 2B-UbEC code is discussed; it shows that the application of the error correcting codes for fault-tolerance is effective and convenient.

Paper Details

Date Published: 28 August 1995
PDF: 5 pages
Proc. SPIE 2620, International Conference on Intelligent Manufacturing, (28 August 1995); doi: 10.1117/12.217513
Show Author Affiliations
Bingrong Wang, Eastern China Jiaotong Univ. (China)

Published in SPIE Proceedings Vol. 2620:
International Conference on Intelligent Manufacturing
Shuzi Yang; Ji Zhou; Cheng-Gang Li, Editor(s)

© SPIE. Terms of Use
Back to Top