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Proceedings Paper

Object-oriented visual language for IC test
Author(s): XiaoMing Wang; QiaoLin Yang
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Paper Abstract

This paper presents a visual language for integrated circuit (IC) test. It abstracts the test flow as several classes which map to some forms. Test engineers can use the form-based environment which reduces the cost of developing high quality programs. Test classes are defined by AT&T C++ 2.0. Forms are implemented by X-Window. All the systems run on a SUN SPARC workstation.

Paper Details

Date Published: 28 August 1995
PDF: 5 pages
Proc. SPIE 2620, International Conference on Intelligent Manufacturing, (28 August 1995); doi: 10.1117/12.217455
Show Author Affiliations
XiaoMing Wang, Institute of Computing Technology (China)
QiaoLin Yang, Institute of Computing Technology (China)


Published in SPIE Proceedings Vol. 2620:
International Conference on Intelligent Manufacturing
Shuzi Yang; Ji Zhou; Cheng-Gang Li, Editor(s)

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