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Proceedings Paper

Measurement of the hemispherical reflectance and transmittance at variable angles of incidence
Author(s): Andreas Gombert; Josef Steinhart; C. Sanowski; Konstantin Forcht; Franz Brucker; Wolfgang Graf; Michael Koehl
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Paper Abstract

An apparatus was built to measure the spectral hemispherical reflectance and transmittance at variable angles of incidence. The apparatus consists of a Fourier-transform spectrometer, polarizers, and two integrating spheres. With one of the spheres, transmittance measurements can be performed, with the other, reflectance or absorptance measurements depending on the transmittance of the samples. The measurement range for transmittance measurements is from 400 nm to 2500 nm and for reflectance or absorptance measurements from 400 nm to 1900 nm. The design of the spheres and the optical set-up is described. The measurement accuracy was determined by measuring well-defined samples. Examples of measurements of different solar selective absorber coatings and anti-reflection layers are shown.

Paper Details

Date Published: 23 August 1995
PDF: 9 pages
Proc. SPIE 2531, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIV, (23 August 1995); doi: 10.1117/12.217338
Show Author Affiliations
Andreas Gombert, Fraunhofer-Institut fuer Solare Energiesysteme (Germany)
Josef Steinhart, Fraunhofer-Institut fuer Solare Energiesysteme (Germany)
C. Sanowski, Fraunhofer-Institut fuer Solare Energiesysteme (Germany)
Konstantin Forcht, Fraunhofer-Institut fuer Solare Energiesysteme (Germany)
Franz Brucker, Fraunhofer-Institut fuer Solare Energiesysteme (Germany)
Wolfgang Graf, Fraunhofer-Institut fuer Solare Energiesysteme (Germany)
Michael Koehl, Fraunhofer-Institut fuer Solare Energiesysteme (Germany)


Published in SPIE Proceedings Vol. 2531:
Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XIV
Carl M. Lampert; Satyen K. Deb; Claes-Goeran Granqvist, Editor(s)

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