Share Email Print
cover

Proceedings Paper

Characterization of IR focal plane test stations
Author(s): Christopher R. Costanzo; Christopher L. Kauffman; Khoa V. Dang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The design and performance of an IR FPA test system are described. The parameters, techniques, and equipment required for an IR test system are discussed. An analysis of focal planes is presented to extract the last dB of performance, emphasizing the minimization of required device testing time. The CECOM test system is presented, including the instrument controller, the five source types for characterizing IR FPAs, the electronics, and the protective plexiglass enclosure. Critical test parameters and bias and clocking supply specifications are set forth. Printers which display the results are described, and a buffer/spooler is suggested to increase output rate. Data presentation is discussed. Tests on FPAs and readouts, such as dc uniformity, rms noise, 1/f noise, detectivity, linearity, and responsivity, can be conducted in an automated mode. The possibility of automated testing of optical crosstalk, spectral response, and optical area is mentioned. Future improvements to the facility are listed. Improved yields and increased FPA testing throughput in IRFPA production programs can result from the IRFPA test system facilities.

Paper Details

Date Published: 1 September 1990
PDF: 10 pages
Proc. SPIE 1308, Infrared Detectors and Focal Plane Arrays, (1 September 1990); doi: 10.1117/12.21732
Show Author Affiliations
Christopher R. Costanzo, U.S. Army Night Vision and Ele (United States)
Christopher L. Kauffman, U.S. Army Night Vision and Ele (United States)
Khoa V. Dang, U.S. Army Night Vision and Ele (United States)


Published in SPIE Proceedings Vol. 1308:
Infrared Detectors and Focal Plane Arrays
Eustace L. Dereniak; Robert E. Sampson, Editor(s)

© SPIE. Terms of Use
Back to Top