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Proceedings Paper

High-resolution 2048 x 16 TDI PtSi IR imaging CCD
Author(s): Marc T. Daigle; Don W. Colvin; Edward T. Nelson; Stuart Brickman; K. W. Wong; Shozo Yoshizumi; Michael B. Elzinga; Paul H. Sorlie; D. Rockafellow; Paul Travers; R. Avel
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Paper Abstract

A 2048 x 16 pixel time delay and integrate (TDI) monolithic focal plane array detector using PtSi Schottky barrier photodiodes and an interline CCD architecture was developed. A high resolution was achieved by using 30-micron pixels, with a high sensitivity through the TDI mode of operation. A ripple clocked vertical shift register was used for higher charge capacity, allowing a 43-percent fill factor with a saturated charge capacity of 530,000 electrons.

Paper Details

Date Published: 1 September 1990
PDF: 11 pages
Proc. SPIE 1308, Infrared Detectors and Focal Plane Arrays, (1 September 1990); doi: 10.1117/12.21720
Show Author Affiliations
Marc T. Daigle, Litton Itek Optical Systems (United States)
Don W. Colvin, Litton Itek Optical Systems (United States)
Edward T. Nelson, Eastman Kodak Co. (United States)
Stuart Brickman, Eastman Kodak Co. (United States)
K. W. Wong, Eastman Kodak Co. (United States)
Shozo Yoshizumi, Eastman Kodak Co. (United States)
Michael B. Elzinga, Eastman Kodak Co. (United States)
Paul H. Sorlie, Eastman Kodak Co. (United States)
D. Rockafellow, Eastman Kodak Co. (United States)
Paul Travers, Eastman Kodak Co. (United States)
R. Avel, Eastman Kodak Co. (United States)


Published in SPIE Proceedings Vol. 1308:
Infrared Detectors and Focal Plane Arrays
Eustace L. Dereniak; Robert E. Sampson, Editor(s)

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