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Proceedings Paper

5-100GHz free-space microwave characterization setup
Author(s): Vasundara V. Varadan; Vijay K. Varadan; Deepak K. Ghodgaonkar
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Paper Abstract

We have set up a state of the art free space measurement system for characterizing the electromagnetic reflection and transmission properties of planar samples in the 5-100 GHz frequency range for both normal and oblique incidence. The key components of the measurement system consists of two spot-focusing antennas mounted on circular tracks on a horizontal table, mode transitions, coaxial cables and a HP851OB network analyzer. The system is fully automated and has been calibrated to yield reliable and accurate values of free space S-parameters of planar samples. The complex electromagnetic properties (e. g., complex permittivity, complex permeability, etc.) of the sample can be measured as a function of frequency. The experimental results for teflon, a microwave ceramic material and silicon rubber-carbonyl iron composites are presented. Measurements can be done in a non-destructive and non-contact mode, that also permits material characterization under high temperature conditions.

Paper Details

Date Published: 1 October 1990
PDF: 6 pages
Proc. SPIE 1307, Electro-Optical Materials for Switches, Coatings, Sensor Optics, and Detectors, (1 October 1990); doi: 10.1117/12.21657
Show Author Affiliations
Vasundara V. Varadan, The Pennsylvania State Univ. (United States)
Vijay K. Varadan, The Pennsylvania State Univ. (United States)
Deepak K. Ghodgaonkar, The Pennsylvania State Univ. (United States)

Published in SPIE Proceedings Vol. 1307:
Electro-Optical Materials for Switches, Coatings, Sensor Optics, and Detectors
Rudolf Hartmann; M. J. Soileau; Vijay K. Varadan, Editor(s)

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