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Proceedings Paper

Indicatrix measurement based on birefringence retardation using phase modulation technology
Author(s): Yoshihiro Mochida
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Paper Abstract

The measurement of 3D anisotropy, which is the measurement of an indicatrix nx, ny, nz is made by the birefringence measurement with normal and inclined incidence of the light beam. Birefringence retardation contains a fast and a slow axis which are caused by the phase difference of two orthogonal light waves. Information obtained will be different, depending on whether the inclination of a sample is made around the fast axis or the slow axis. Also, depending on the sample to be measured, it is sometimes necessary to incline the sample by changing the azimuthal angle of the sample. Taking into account the recent developments mentioned above, an automatic measuring system of an indicatrix is discussed.

Paper Details

Date Published: 2 August 1995
PDF: 5 pages
Proc. SPIE 2576, International Conference on Optical Fabrication and Testing, (2 August 1995); doi: 10.1117/12.215591
Show Author Affiliations
Yoshihiro Mochida, ORC Manufacturing Co., Ltd. (Japan)

Published in SPIE Proceedings Vol. 2576:
International Conference on Optical Fabrication and Testing
Toshio Kasai, Editor(s)

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