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Proceedings Paper

Precise measurements of refractive index distribution and optical surfaces
Author(s): Tadashi Morokuma
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Paper Abstract

Described are the two frontier areas of interest, that is, the measurement of refractive index distribution in gradient index glasses and the precise evaluation and measurement of optical surfaces for high precision optics. Scanning total reflection method and interferometric methods are applied to the refractive index measurement with an accuracy of 10-4 to 10-5. An AFM is found very useful for the evaluation of non-conductive surfaces as well as multilayers for x-ray optics. Methods for absolute measurement of surface profiles are proposed in consideration of the deformation due to gravity and another method for large surfaces.

Paper Details

Date Published: 2 August 1995
PDF: 9 pages
Proc. SPIE 2576, International Conference on Optical Fabrication and Testing, (2 August 1995); doi: 10.1117/12.215584
Show Author Affiliations
Tadashi Morokuma, Olympus Optical Co., Ltd. (Japan)


Published in SPIE Proceedings Vol. 2576:
International Conference on Optical Fabrication and Testing
Toshio Kasai, Editor(s)

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