Share Email Print
cover

Proceedings Paper

Optical corrosion meter
Author(s): Khaled J. Habib; F. Al-Sabti; H. Al-Mazedi
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In a previous study, a mathematical model relating surface and bulk behaviors of metals in aqueous solutions has been developed. The model was established based on principles of holographic interferometry for measuring dissolution, i.e. mass loss, and on those of electrochemisty for measuring the bulk electronic current, i.e. corrosion current. In the present work, an optical corrosion-meter was built based on the above model. The corrosion- meter consists of an electrochemical cell in which the sample is immersed in aqueous solution. Furthermore, the corrosion-meter has a holographic camera with a thermoplastic film for in- situ processing holograms in order to obtain real time holographic interferoms of the sample in the electrochemical cell. Results of measuring the corrosion current density of different alloys in aqueous solutions. In addition, the corresponding corrosion potential for each corrosion current density was measured by a potentialmeter. As a result, the corrosion current density of Aluminium, stainless steel, and low carbon steel in 1M KCl, 1M NaCl, and 1M NaOH solutions were obtained. A comparison between the corrosion data of samples showed that the corrosion current density of the stainless steel in 1M NaCl is nearly three folds higher than that of the Aluminium in 1M KCl and the low carbon steel in 1M NaOH.

Paper Details

Date Published: 27 July 1995
PDF: 8 pages
Proc. SPIE 2577, International Conference on Applications of Optical Holography, (27 July 1995); doi: 10.1117/12.215318
Show Author Affiliations
Khaled J. Habib, Kuwait Institute for Scientific Research (Kuwait)
F. Al-Sabti, Kuwait Institute for Scientific Research (Kuwait)
H. Al-Mazedi, Kuwait Institute for Scientific Research (Kuwait)


Published in SPIE Proceedings Vol. 2577:
International Conference on Applications of Optical Holography
Toshio Honda, Editor(s)

© SPIE. Terms of Use
Back to Top