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Proceedings Paper

Laser-induced damage in dielectrics with nanosecond to spupicosecond pulses I: experimental
Author(s): Brent C. Stuart; Steve M. Herman; Michael D. Perry
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Paper Abstract

We report extensive laser-induced damage threshold measurements on pure and multilayer dielectrics at 1053 and 526 nm for pulse durations, (tau) , ranging from 140 fs to 1 ns. Qualitative differences in the morphology of damage and a departure from the diffusion-dominated (tau) 1/2 scaling indicate that damage results from plasma formation and ablation for (tau) <EQ10 ps and from conventional melting and boiling for (tau) >50 ps. A theoretical model based on electron production via multiphoton ionization, Joule heating, and collisional (avalanche) ionization is in good agreement with both the pulsewidth and wavelength scaling experimental results.

Paper Details

Date Published: 14 July 1995
PDF: 11 pages
Proc. SPIE 2428, Laser-Induced Damage in Optical Materials: 1994, (14 July 1995); doi: 10.1117/12.213772
Show Author Affiliations
Brent C. Stuart, Lawrence Livermore National Lab. (United States)
Steve M. Herman, Lawrence Livermore National Lab. (United States)
Michael D. Perry, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 2428:
Laser-Induced Damage in Optical Materials: 1994
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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