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Proceedings Paper

Absorption measurement of thin films by using photothermal techniques: the influence of thermal properties
Author(s): Zhouling Wu; Pao-Kuang Kuo; Robert L. Thomas; Zhengxiu Fan
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Paper Abstract

Photothermal techniques are widely used for measuring optical absorption of thin film coatings. In these applications the calibration of photothermal signal is typically based on the assumption that the thermal properties of the thin film make very little contribution. In this paper we take mirage technique as an example and present a detailed analysis of the influence of thin film thermal properties on absorption measurement. The results show that the traditional calibration method is not valid on surprisingly many situations. Our theoretical calculations are verified by experimental results, and the thin film coatings investigated in this work include both single and multiple layer samples. Based on the detailed studies, new calibration methods are proposed for absorption measurements by using thermal wave analysis.

Paper Details

Date Published: 14 July 1995
PDF: 1 pages
Proc. SPIE 2428, Laser-Induced Damage in Optical Materials: 1994, (14 July 1995); doi: 10.1117/12.213742
Show Author Affiliations
Zhouling Wu, Eastern Michigan Univ. (United States)
Pao-Kuang Kuo, Wayne State Univ. (United States)
Robert L. Thomas, Wayne State Univ. (United States)
Zhengxiu Fan, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 2428:
Laser-Induced Damage in Optical Materials: 1994
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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