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Proceedings Paper

Behavior of laser-induced emission intensity versus laser power density during breakdown of optical materials
Author(s): Xianglei Mao; Andres J. Fernandez; Richard E. Russo
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Paper Abstract

Breakdown in SiO2 is studied versus fluence using an intensified CCD spectrometer. Broad-band photoluminescence spectra were measured versus number of laser pulses. Before the breakdown of fused silica, the intensity of this photoluminescence increases. After breakdown, a plasma is formed and ablated Si emission lines are measured. The plasma is characterized by its emission spectra and excitation temperature temporal profiles. The temperature profiles of the plasma are calculated by the Bolzmann method. These data are studied to provide fundamental information of breakdown mechanisms in optical materials.

Paper Details

Date Published: 14 July 1995
PDF: 10 pages
Proc. SPIE 2428, Laser-Induced Damage in Optical Materials: 1994, (14 July 1995); doi: 10.1117/12.213739
Show Author Affiliations
Xianglei Mao, Lawrence Berkeley Lab. (United States)
Andres J. Fernandez, Lawrence Berkeley Lab. (United States)
Richard E. Russo, Lawrence Berkeley Lab. (United States)


Published in SPIE Proceedings Vol. 2428:
Laser-Induced Damage in Optical Materials: 1994
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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