Share Email Print
cover

Proceedings Paper

Measurements of the temporal response of vanadium oxide thin films in the infrared
Author(s): G. J. Calverley; David C. Emmony; David A. Huckridge; Keith L. Lewis
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

High resolution 400ns TEA carbon dioxide laser pulses with a 100ns rise time were used to observe the 10.6 micrometers radiation transmitted by polycrystalline vanadium oxide coatings deposited on germanium substrates. The variation in the transmission and reflection of the vanadium oxide coatings was simultaneously observed throughout the duration of the incident pulse over a range of incident fluences. The observation of fluence related changes in the behavior of both the transmitted and reflected pulses showed that the coatings exhibited a semiconductor-to-metallic phase transition that was power related and not energy dependent.

Paper Details

Date Published: 14 July 1995
PDF: 8 pages
Proc. SPIE 2428, Laser-Induced Damage in Optical Materials: 1994, (14 July 1995); doi: 10.1117/12.213719
Show Author Affiliations
G. J. Calverley, Loughborough Univ. of Technology (United Kingdom)
David C. Emmony, Loughborough Univ. of Technology (United Kingdom)
David A. Huckridge, Defence Research Agency (United Kingdom)
Keith L. Lewis, Defence Research Agency (United Kingdom)


Published in SPIE Proceedings Vol. 2428:
Laser-Induced Damage in Optical Materials: 1994
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top