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Materials characterization, optical spectroscopy, and laser damage studies of electrochromically and photochromically damaged KTiOPO4 (KTP)
Author(s): John R. Quagliano; Roger R. Petrin; T. C. Trujillo; R. Wenzel; L. John Jolin; M. T. Paffett; C. J. Maggiore; Nigel J. Cockroft; John C. Jacco
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Paper Abstract

The techniques utilized to study the surface and bulk properties of KTiOPO4 (KTP) were Rutherford backscattering (RBS), particle induced x-ray emission (PIXE), secondary ion mass spectrometry (SIMS), optical absorption and emission spectroscopy, and controlled laser damage. RBS and SIMS results provide strong evidence for potassium ion and titanium ion migration from the bulk to the electrode surface under an applied DC voltage. Optical measurements suggest the presence of Ti3+ ions in pristine, EC and PC damages KTP. Catastrophic damage was induced models will be presented to rationalize the RBS, PIXE and SIMS data for the impurities, and a damage mechanism consistent with the findings of the laser damage and optical absorption and emission experiments will be discussed.

Paper Details

Date Published: 14 July 1995
PDF: 8 pages
Proc. SPIE 2428, Laser-Induced Damage in Optical Materials: 1994, (14 July 1995); doi: 10.1117/12.213710
Show Author Affiliations
John R. Quagliano, Los Alamos National Lab. (United States)
Roger R. Petrin, Los Alamos National Lab. (United States)
T. C. Trujillo, Los Alamos National Lab. (United States)
R. Wenzel, Los Alamos National Lab. (United States)
L. John Jolin, Los Alamos National Lab. (United States)
M. T. Paffett, Los Alamos National Lab. (United States)
C. J. Maggiore, Los Alamos National Lab. (United States)
Nigel J. Cockroft, Los Alamos National Lab. (United States)
John C. Jacco, Philips Components (United States)


Published in SPIE Proceedings Vol. 2428:
Laser-Induced Damage in Optical Materials: 1994
Harold E. Bennett; Arthur H. Guenther; Mark R. Kozlowski; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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