Share Email Print
cover

Proceedings Paper

Thermal stressing techniques for flaw characterization with shearography
Author(s): Jane W. Maclachlan Spicer; John L. Champion; Robert Osiander; James B. Spicer
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Controlled heating of a test specimen with a laser source provides several advantages for flaw detection using shearographic detection. This stressing method is non-contacting, can be localized, and allows defect information to be obtained while heating. In addition, the beam profile can be tailored to aid in the detection of different defect types. This paper presents results of simultaneous observations of material response to an applied thermal load using both TRIR and shearographic detection methods. Of particular importance is the demonstration that the depth of a defect can be determined by measuring the time-dependence of the shearographic fringe development during heating.

Paper Details

Date Published: 7 July 1995
PDF: 10 pages
Proc. SPIE 2455, Nondestructive Evaluation of Aging Aircraft, Airports, Aerospace Hardware, and Materials, (7 July 1995); doi: 10.1117/12.213539
Show Author Affiliations
Jane W. Maclachlan Spicer, Johns Hopkins Univ. (United States)
John L. Champion, Johns Hopkins Univ. (United States)
Robert Osiander, Johns Hopkins Univ. (United States)
James B. Spicer, Johns Hopkins Univ. (United States)


Published in SPIE Proceedings Vol. 2455:
Nondestructive Evaluation of Aging Aircraft, Airports, Aerospace Hardware, and Materials
Tobey M. Cordell; Raymond D. Rempt, Editor(s)

© SPIE. Terms of Use
Back to Top