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Proceedings Paper

Assembly line inspection using neural networks
Author(s): Alastair D. McAulay; Paul Danset; Devert W. Wicker
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Paper Details

Date Published: 1 September 1990
PDF: 11 pages
Proc. SPIE 1297, Hybrid Image and Signal Processing II, (1 September 1990); doi: 10.1117/12.21328
Show Author Affiliations
Alastair D. McAulay, Wright State Univ. (United States)
Paul Danset, Wright State Univ. (United States)
Devert W. Wicker, Wright State Univ. (United States)


Published in SPIE Proceedings Vol. 1297:
Hybrid Image and Signal Processing II
David P. Casasent; Andrew G. Tescher, Editor(s)

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