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Proceedings Paper

Peculiarities of registration of nonlinear photoanisotropy effects in noncollinear geometry of interacting waves
Author(s): Igor I. Gancheryonok; Andrei V. Lavrinenko
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Paper Abstract

T.he probleni of geometry of puip and probe waves under investigation of nonlinear phctoanisotropy (1ightinthiced birefringence and dichroizi) effects in initially isotropic Ledia are of very importance. However up to now, there are a few papers dedicated to detailed analysis of these questions. 1foreover, a nuniber of peculiarities of registration of effects of anisotropy induced by powerful puLping are unknown yet. This paper solves some of these problem. Using Presnel's operator forsalis (1] we succeeded in estimating of influence of finite quantity of convergence angle between probe and pumping wave normals on registered signal intensity in optically heterodyned polarization spectroscopy and nonlinear polarization spectroscopy schemes. In both cases it is shown that noncollinearity of interacting beams influences on the resonance profile form, though this influence can be rather small. In nonlinear photoanisotropy examination scheme [2) , we are the first to find the polarization conditions for correct interpretation of experimental data. Noticeable violal.ion of Kleinman symmetry for cubic susceptibility tensor components of Pluorescein-doped based acid glass is found. This fact is ecplained by the influence of thermal gratings induced in the medium by nonparallel probe and pumping waves. It is particularly actual in frequency degenerated case. The theoretical analysis of reflection scheme for studying light-S induced anisotropy is also presented. It opens new perspectives under investigation of nonlinear photoanisotropy phenomena.

Paper Details

Date Published: 23 June 1995
PDF: 1 pages
Proc. SPIE 2208, Refractometry, (23 June 1995); doi: 10.1117/12.213201
Show Author Affiliations
Igor I. Gancheryonok, Belarussian State Univ. (Belarus)
Andrei V. Lavrinenko, Belarussian State Univ. (Belarus)


Published in SPIE Proceedings Vol. 2208:
Refractometry
Maksymilian Pluta; Mariusz Szyjer, Editor(s)

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