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Proceedings Paper

Effects of absorption and coupling strength on accuracy of dark mode refractometry
Author(s): Jaromir Pistora; Dalibor Ciprian
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Paper Abstract

The study of guided waves in a thin layer allows a precise characterization of refractive index and thickness. In our experimental equipment the propagation constants of guided modes were measured by the dark mode spectroscopy technique. Series of dark lines known as the m-lines were observed on the screen. Angles synchronous to the propagating modes were calculated from measurement of the angular distribution of the m-lines. The positions of the m-lines depends on thin film absorption and coupling strength.

Paper Details

Date Published: 23 June 1995
PDF: 5 pages
Proc. SPIE 2208, Refractometry, (23 June 1995); doi: 10.1117/12.213177
Show Author Affiliations
Jaromir Pistora, Technical Univ. Ostrava (Czech Republic)
Dalibor Ciprian, Technical Univ. Ostrava (Czech Republic)


Published in SPIE Proceedings Vol. 2208:
Refractometry
Maksymilian Pluta; Mariusz Szyjer, Editor(s)

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