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Proceedings Paper

Model supported positioning
Author(s): Richard W. Ely; Joseph A. Di Girolamo; James C. Lundgren
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Paper Abstract

We discuss Texas Instrument's approach to the Model Supported Positioning (MSP) Project. There are two main goals of the MSP project. The first is to meet the model-to-image registration needs of the Research and Development for Image Understanding Systems (RADIUS) Project. The second goal is to provide an automated capability for deriving more accurate absolute image position information using a scene model with accurate ground control positions. The approach is to use model-to-image registration to locate features in the image whose absolute 3 - 4 positions are precisely known from the model. Rigorous photogrammetry is used to refine the image acquisition parameters by minimizing the error between the known 3D positions and the image derived positions. While we briefly discuss the parameter refinement step, the emphasis of this paper is on the registration algorithm. We first estimate a coarse offset error vector between the image and the model. This estimate is from a vector registration algorithm which matches straight lines extracted from a reduced resolution image to lines from the site model. The image location of each 3D control feature is then determined using oriented line and vertex operators in the full-resolution image. A least-squares approach is used to refine the image acquisition parameters to match the known control feature positions.

Paper Details

Date Published: 5 July 1995
PDF: 11 pages
Proc. SPIE 2486, Integrating Photogrammetric Techniques with Scene Analysis and Machine Vision II, (5 July 1995); doi: 10.1117/12.213133
Show Author Affiliations
Richard W. Ely, Texas Instruments Inc. (United States)
Joseph A. Di Girolamo, Texas Instruments Inc. (United States)
James C. Lundgren, Texas Instruments Inc. (United States)


Published in SPIE Proceedings Vol. 2486:
Integrating Photogrammetric Techniques with Scene Analysis and Machine Vision II
David M. McKeown; Ian J. Dowman, Editor(s)

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