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Proceedings Paper

Limits of optical and electrical fan-out versus power and fan-out versus bandwidth
Author(s): Tie Wang; Raymond Arrathoon
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Paper Abstract

The present comparative study of fundamental differences between electrical and optical interconnects proceeds from an analysis based on Maxwell''s equations. Attention is given to the combinational properties of the electrical interconnects for N gates, within the constraints of microelectronics technology. A gate-level comparison is conducted between electronic and optoelectronic fan-out vs switching time and fan-out vs power. Signal distortion, electromigration, and thermal transfer problems are associated with interconnect fan-out; in general, smaller feature sizes lead to greater electromigration effects than signal distortion effects at all frequencies.

Paper Details

Date Published: 1 September 1990
PDF: 17 pages
Proc. SPIE 1297, Hybrid Image and Signal Processing II, (1 September 1990); doi: 10.1117/12.21307
Show Author Affiliations
Tie Wang, Digital Optics, Inc. (United States)
Raymond Arrathoon, Digital Optics, Inc. (United States)

Published in SPIE Proceedings Vol. 1297:
Hybrid Image and Signal Processing II
David P. Casasent; Andrew G. Tescher, Editor(s)

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