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Proceedings Paper

Progress in II-VI photorefractives
Author(s): George A. Brost; Kevin M. Magde; Sudhir B. Trivedi
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Paper Abstract

Photorefractive ZnTe and CdTe crystals doped with vanadium and/or manganese were grown and characterized in the wavelength range of 0.63 micrometers to 1.52 micrometers . The highest gain was observed in ZnTe:Mn:V (1.5 cm-1 at 0.63 micrometers ). Through the use of both dopants the effective trap density was increased over an order of magnitude to 4.8 X 1015 cm-3. The wavelength sensitivity range of cadmium telluride photorefractives was extended to less than 0.6 micrometers in CD0.55Mn0.45Te:V.

Paper Details

Date Published: 30 June 1995
PDF: 5 pages
Proc. SPIE 2481, Photonic Device Engineering for Dual-Use Applications, (30 June 1995); doi: 10.1117/12.212714
Show Author Affiliations
George A. Brost, Air Force Rome Lab. (United States)
Kevin M. Magde, Air Force Rome Lab. (United States)
Sudhir B. Trivedi, Brimrose Corp. of America (United States)


Published in SPIE Proceedings Vol. 2481:
Photonic Device Engineering for Dual-Use Applications
Andrew R. Pirich, Editor(s)

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