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Proceedings Paper

Active stabilization of ESPI systems for applications under rough conditions
Author(s): Konstatin Galanulis; Thomas Bunkus; Reinhold Ritter
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Paper Abstract

A method for the active stabilization of an out-of-plane electronic speckle pattern interferometer (ESPI) is presented. A compact Michelson interferometer is adapted to the ESPI head to determine the relative motion between the ESPI and the object. The signal of the Michelson interferometer is prepared by a microcontroller and supplied as an addition signal to the phase shifting unit of the ESPI. The presented solution is a practical method for applications with real-time ESPI. It increases the potential of ESPI especially for applications outside of an optical laboratory under rough conditions.

Paper Details

Date Published: 23 June 1995
PDF: 5 pages
Proc. SPIE 2545, Interferometry VII: Applications, (23 June 1995); doi: 10.1117/12.212635
Show Author Affiliations
Konstatin Galanulis, Gesellschaft fuer Optische Messtechnik mbH (Germany)
Thomas Bunkus, Technische Univ. Braunschweig (Germany)
Reinhold Ritter, Technische Univ. Braunschweig (Germany)

Published in SPIE Proceedings Vol. 2545:
Interferometry VII: Applications
Ryszard J. Pryputniewicz; Gordon M. Brown; Werner P. O. Jueptner, Editor(s)

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