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Proceedings Paper

Application of automated grating interferometry to material microstructure studies
Author(s): Leszek A. Salbut; Grzegorz Dymny; Marcin Ciesielski
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Paper Abstract

High-sensitivity, automatic grating interferometry (AGI) system is shown as the effective experimental tool for the material microstructure studies. Two interferometers, laboratory AGI for static and portable AGI for dynamic loading of the specimen are presented. The full methodology of a sample preparation, measurement and data analysis process with special attention paid to combining the information about grain borders and displacement/strain fields distribution is described. The experimental displacement fields obtained at the borders between grains in bicrystal, tricrystal, and polycrystal aluminum alloy are presented. The strain maps of tricrystal sample are presented and discussed.

Paper Details

Date Published: 23 June 1995
PDF: 7 pages
Proc. SPIE 2545, Interferometry VII: Applications, (23 June 1995); doi: 10.1117/12.212634
Show Author Affiliations
Leszek A. Salbut, Warsaw Univ. of Technology (Poland)
Grzegorz Dymny, Warsaw Univ. of Technology (Poland)
Marcin Ciesielski, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 2545:
Interferometry VII: Applications
Ryszard J. Pryputniewicz; Gordon M. Brown; Werner P. O. Jueptner, Editor(s)

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