Share Email Print

Proceedings Paper

Numerical simulation of electron-impact x-ray sources
Author(s): Martin E. Sulkanen; Jeffery J. Kolodziejczak; George Chartas
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Electron-impact x-ray sources will be used to calibrate the Advanced X-Ray Astrophysics Facility (AXAF), and models of the source x-ray spectra are necessary in forecasting the calibration performance. We simulate the spectra of x-ray lines and continuum (0.1 - 13 keV) arising from electron impact on solid targets. We use simple models for electron transport, line and continuum emissivities, and radiative transport through the target. The electrons are attenuated in energy in the target but are unscattered in direction. The continuum x-ray emission is modeled as bremsstrahlung, and the characteristic x-ray line emission is modeled by electron collisional ionization followed by radiative decay to form the lines. X-ray attenuation is also included in the radiative transfer through the target. Multilayer or compound targets can be easily treated. We compare the spectra produced by this model to the model of Pella et al. and data from metal targets.

Paper Details

Date Published: 20 June 1995
PDF: 6 pages
Proc. SPIE 2515, X-Ray and Extreme Ultraviolet Optics, (20 June 1995); doi: 10.1117/12.212605
Show Author Affiliations
Martin E. Sulkanen, NASA Marshall Space Flight Ctr. (United States)
Jeffery J. Kolodziejczak, NASA Marshall Space Flight Ctr. (United States)
George Chartas, Harvard-Smithsonian Astrophysical Observatory (United States)

Published in SPIE Proceedings Vol. 2515:
X-Ray and Extreme Ultraviolet Optics
Richard B. Hoover; Arthur B. C. Walker Jr., Editor(s)

© SPIE. Terms of Use
Back to Top