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Proceedings Paper

Effects of intense x-ray radiation on polycapillary fiber performance
Author(s): Bimal K. Rath; D. C. Aloisi; Donald H. Bilderback; Ning Gao; Walter M. Gibson; F. A. Hofmann; B. E. Homan; Chris J. Jezewski; Ira Klotzko; J. M. Mitchell; Scott M. Owens; Johannes B. Ullrich; Lei Wang; Gregory M. Wells; Qi-Fan Xiao; Carolyn A. MacDonald
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Paper Abstract

Several applications of Kumakhov polycapillary optics require extended exposure to intense x- ray radiation. No degradation of performance has been observed when using polycapillary x- ray optics with laboratory sources. As part of an ongoing study to develop an understanding of damage mechanisms and performance limitations, borosilicate glass polycapillaries have been exposed to white beam bending magnet synchrotron radiation with peak energies of 5 and 11 keV, and focused broad band energy centered at 1.4 keV synchrotron radiation. In situ and ex situ measurements of degradation of x-ray transport efficiency have been performed at doses up to 1.8 MJ/cm2 at ambient and elevated temperatures. No decrease in transmission was observed for in situ measurement of fibers exposed to 1.4 keV photons at doses up to 1.4 MJ/cm2. Ambient temperature exposure to higher photon energies causes degradation that can be recovered by low temperature annealing. Exposure at elevated temperatures prevented any measurable damage to rigid fibers, at doses up to 800 kj/cm2.

Paper Details

Date Published: 15 June 1995
PDF: 11 pages
Proc. SPIE 2519, X-Ray and Ultraviolet Sensors and Applications, (15 June 1995); doi: 10.1117/12.211907
Show Author Affiliations
Bimal K. Rath, SUNY/Albany (United States)
D. C. Aloisi, SUNY/Albany (United States)
Donald H. Bilderback, Cornell Univ. (United States)
Ning Gao, SUNY/Albany (United States)
Walter M. Gibson, SUNY/Albany (United States)
F. A. Hofmann, SUNY/Albany (United States)
B. E. Homan, SUNY/Albany (United States)
Chris J. Jezewski, SUNY/Albany (United States)
Ira Klotzko, SUNY/Albany (United States)
J. M. Mitchell, SUNY/Albany (United States)
Scott M. Owens, SUNY/Albany (United States)
Johannes B. Ullrich, SUNY/Albany (United States)
Lei Wang, SUNY/Albany (United States)
Gregory M. Wells, Univ. of Wisconsin/Madison (United States)
Qi-Fan Xiao, X-ray Optical Systems, Inc. (United States)
Carolyn A. MacDonald, SUNY/Albany (United States)

Published in SPIE Proceedings Vol. 2519:
X-Ray and Ultraviolet Sensors and Applications
Richard B. Hoover; Mark Bennett Williams, Editor(s)

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