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Proceedings Paper

Application of hybrid detector technology for digital mammography
Author(s): Hans Roehrig; Tong Yu; Stephen D. Gaalema; S. R. Dev Sharma; John A. Minteer; William E. Yorke
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Paper Abstract

A digital x-ray detector applying hybrid detector technology based on indium metal bump- bonding techniques was evaluated at x-ray energies of about 19.5 keV. Silicon of about 1 mm thickness forms the actual detector, converting x-rays directly into electrons (rather than generating light and converting light to photo-electrons). Time-delay-integration increases the sensitivity. Linearity, modulation transfer function, and noise power spectrum were evaluated. The results demonstrate that the system is useful as scanning x-ray detector for digital mammography and can meet and even exceed the performance of the conventional film/screen system.

Paper Details

Date Published: 15 June 1995
PDF: 9 pages
Proc. SPIE 2519, X-Ray and Ultraviolet Sensors and Applications, (15 June 1995); doi: 10.1117/12.211899
Show Author Affiliations
Hans Roehrig, Optical Sciences Ctr./Univ. of Arizona (United States)
Tong Yu, Optical Sciences Ctr./Univ. of Arizona (United States)
Stephen D. Gaalema, Primex Corp. (United States)
S. R. Dev Sharma, Primex Corp. (United States)
John A. Minteer, Primex Corp. (United States)
William E. Yorke, Primex Corp. (United States)


Published in SPIE Proceedings Vol. 2519:
X-Ray and Ultraviolet Sensors and Applications
Richard B. Hoover; Mark Bennett Williams, Editor(s)

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