Share Email Print

Proceedings Paper

Optical fiber digital speckle pattern correlation method for displacement measurement
Author(s): Rongxun Liu; Xinwei Liu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper briefly reviews present situation on optical fiber-speckle method used for measuring displacements or deformations of an object, and the optical fiber-digital white light speckle patterns correlation method for whole field displacement measurement on a remote surface of a trial object is revealed. The principle of correlation method is demonstrated. A special program for image correlation analysis by computer C language, according to the fundamental principle of digital speckle patterns correlation searching and reading/writing mode of MS4213 image board has been written. The set-up was that a coherent multimode fiber bundle (MBE) was used to transmit white light speckles on a test surface onto a target of CCD camera, then, using microcomputer, monitor system, the displacements on the surface have been obtained. Two experiments which were used to measure displacements of a rigid rotational disk around its axis and deflections of a beam in three-point bending had been made. The experimental results agree well with theory. We came to a conclusion that under the circumstances of a large displacement/deformation, the method contributed in this study has an obvious advantage in measuring a whole field displacement/deformation of a remote object or an interior of nontransparent structure.

Paper Details

Date Published: 14 June 1995
PDF: 8 pages
Proc. SPIE 2544, Interferometry VII: Techniques and Analysis, (14 June 1995); doi: 10.1117/12.211889
Show Author Affiliations
Rongxun Liu, Beijing Univ. of Chemical Technology (China)
Xinwei Liu, Beijing Univ. of Chemical Technology (China)

Published in SPIE Proceedings Vol. 2544:
Interferometry VII: Techniques and Analysis
Malgorzata Kujawinska; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)

© SPIE. Terms of Use
Back to Top