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Proceedings Paper

Frequency analysis of lateral shear interferometers
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Paper Abstract

Lateral shear interferometers (LSI) are nowadays widely used for the analysis of optical wavefronts. These LSI are robust to vibration of the experimental set-up and of easy implementation. Application of these interferometers is large and well documented in the literature. The analysis of the interferograms produced by LSIs have been made using derivative approximations. These approximations are valid whenever the wavefront being analyzed is smooth and/or a small amount of shearing is used. In this work we present a frequency domain analysis for LSIs and we point out some of the errors that may arise using the standard analyzing techniques.

Paper Details

Date Published: 14 June 1995
PDF: 5 pages
Proc. SPIE 2544, Interferometry VII: Techniques and Analysis, (14 June 1995); doi: 10.1117/12.211882
Show Author Affiliations
Daniel Malacara-Hernandez, Ctr. de Investigaciones en Optica, A.C. (Mexico)
Manuel Servin Guirado, Ctr. de Investigaciones en Optica, A.C. (Mexico)

Published in SPIE Proceedings Vol. 2544:
Interferometry VII: Techniques and Analysis
Malgorzata Kujawinska; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)

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