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Proceedings Paper

Three-dimensional whole field deformation measurement by the diffraction principle
Author(s): Konstatin Galanulis; Reinhold Ritter
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Paper Abstract

A method for measuring deformation using diffraction of light from a grating attached to the surface of flat specimen is presented. By detecting the amplitude and the phase of the diffraction pattern of this grating, its transmission or reflection function can be calculated by the Kirchhoff-Integral. The comparison of these functions in different state of load, leads to the whole-field information of the inplane strain and the out-of-plane dispacement distribution for the illuminated area of the specimen.

Paper Details

Date Published: 14 June 1995
PDF: 8 pages
Proc. SPIE 2544, Interferometry VII: Techniques and Analysis, (14 June 1995); doi: 10.1117/12.211880
Show Author Affiliations
Konstatin Galanulis, Gesellschaft fuer Optische Messtechnik mbH (Germany)
Reinhold Ritter, Technische Univ. Braunschweig (Germany)

Published in SPIE Proceedings Vol. 2544:
Interferometry VII: Techniques and Analysis
Malgorzata Kujawinska; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)

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