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Proceedings Paper

Investigation of the Fourier transform method in analysis of photo-carrier fringe patterns
Author(s): Xide Li; Zheng Zhang; Xiaoping Wu
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Paper Abstract

The factors that affect the accuracy of photo-carrier technique are mainly speckle noise, additive random noise, gradient change of phase function and boundary. They have been simulated by a microcomputer and their effects on phase demodulation when FFT method is used have been studied in this paper. Besides, the bandwidth and undistorted demodulation characteristics in photo-carrier measurement have been investigated with FFT analysis method.

Paper Details

Date Published: 14 June 1995
PDF: 11 pages
Proc. SPIE 2544, Interferometry VII: Techniques and Analysis, (14 June 1995); doi: 10.1117/12.211875
Show Author Affiliations
Xide Li, Univ. of Science and Technology of China (China)
Zheng Zhang, Univ. of Science and Technology of China (China)
Xiaoping Wu, Univ. of Science and Technology of China (China)

Published in SPIE Proceedings Vol. 2544:
Interferometry VII: Techniques and Analysis
Malgorzata Kujawinska; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)

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