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Proceedings Paper

Optoelectronic shearography: two wavelength slope measurement
Author(s): J.-R. Huang; Ralph P. Tatam
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Paper Abstract

A technique for the slope measurement of objects by using an electronic shearography system is presented. To detect the gradients of an object shape, a laser diode is modulated to produce two wavelengths on successive image frames. These two frames are then subtracted to generate the correlation fringes which depict the slope variation. The theory of this technique is derived and objects of conical, cylindrical, and spherical shapes are measured. Experimental results are demonstrated.

Paper Details

Date Published: 14 June 1995
PDF: 9 pages
Proc. SPIE 2544, Interferometry VII: Techniques and Analysis, (14 June 1995); doi: 10.1117/12.211869
Show Author Affiliations
J.-R. Huang, Cranfield Univ. (United Kingdom)
Ralph P. Tatam, Cranfield Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 2544:
Interferometry VII: Techniques and Analysis
Malgorzata Kujawinska; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)

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