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Proceedings Paper

Expert system for geologic mapping with imaging spectrometers
Author(s): Fred A. Kruse; Olivier Seznec; P. M. Krotkov
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Paper Abstract

Techniques have been developed for the extraction and characterization of absorption features from visible and infrared reflectance spectra and an expert system has been designed, implemented, and successfully tested that allows automated identification of minerals based on their spectral characteristics. A suite of laboratory spectra of common minerals was analyzed and the absorption band characteristics tabulated and used to develop a generalized knowledge base for analysis of the reflectance spectra. A tree hierarchy was designed to emulate the decision process followed by an experienced analyst for analysis of laboratory and field reflectance spectra and aircraft imaging spectrometer spectra. Good results were obtained with the expert system for all three types of spectra, with the critical factor in the analysis being the signal-to-noise ratio of the spectral data.

Paper Details

Date Published: 1 January 1990
PDF: 14 pages
Proc. SPIE 1293, Applications of Artificial Intelligence VIII, (1 January 1990); doi: 10.1117/12.21142
Show Author Affiliations
Fred A. Kruse, Univ. of Colorado/Boulder (United States)
Olivier Seznec, Univ. of Colorado/Boulder (United States)
P. M. Krotkov, Univ. of Colorado/Boulder (United States)


Published in SPIE Proceedings Vol. 1293:
Applications of Artificial Intelligence VIII
Mohan M. Trivedi, Editor(s)

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