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Proceedings Paper

Multispectral IR signature polarimetry for detection of mines and unexploded ordnance (UXO)
Author(s): Malcolm A. LeCompte; Frank J. Iannarilli; Davis B. Nichols; Robert R. Keever
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Paper Abstract

The passive multispectral IR polarization signature attributes of mines and background are observable to an appropriately designed detection system. The processes that create signature polarization are spectrally dependent. At shorter wavelengths, reflected solar radiation produces polarization which is perpendicular to the plane of incidence. At long wavelengths, the reflected sunlight is relatively weak and polarization of thermal emissions, which are parallel to the plane of incedence, may dominate. A multispectral polarimetric imaging system could measure a scene's percent and angle of polarization attributes in different spectral regimes. These images can be spatially compared to reveal the presence of manmade polarizing features such as the exposed surfaces of mines or anomalous perturbations to normal background. This information would be processed by suitable discrimination algorithms which might cross-correlate the spatial polarimetric and spectral channels. Aerodyne Research, Inc. and Boeing Defense and Space Group of Seattle, WA have investigated the feasibility of employing passive IR multispectral polarimetry to locate and identify land mines. The results of this investigation, which used a combination of model- based analysis and field measurements, are reported.

Paper Details

Date Published: 20 June 1995
PDF: 13 pages
Proc. SPIE 2496, Detection Technologies for Mines and Minelike Targets, (20 June 1995); doi: 10.1117/12.211315
Show Author Affiliations
Malcolm A. LeCompte, Aerodyne Research, Inc. (United States)
Frank J. Iannarilli, Aerodyne Research, Inc. (United States)
Davis B. Nichols, Boeing Defense & Space Group (United States)
Robert R. Keever, Boeing Defense & Space Group (United States)


Published in SPIE Proceedings Vol. 2496:
Detection Technologies for Mines and Minelike Targets
Abinash C. Dubey; Ivan Cindrich; James M. Ralston; Kelly A. Rigano, Editor(s)

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