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Proceedings Paper

High-sensitivity-time-integrated measurement devices
Author(s): A. Shlifer; Michael Mesh; Moshe Tur
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Paper Abstract

High sensitivity, ring-type measurement devices based on acousto-optic and fiber-optic delay lines are described. Applications of these devices for linear and angular displacements with resolution of 0.1 micrometers and 1 (mu) rad are shown. Methods of further improvement of the devices' characteristics are discussed.

Paper Details

Date Published: 6 June 1995
PDF: 9 pages
Proc. SPIE 2426, 9th Meeting on Optical Engineering in Israel, (6 June 1995); doi: 10.1117/12.211226
Show Author Affiliations
A. Shlifer, Tel-Aviv Univ. (Israel)
Michael Mesh, Tel-Aviv Univ. (Israel)
Moshe Tur, Tel-Aviv Univ. (Israel)


Published in SPIE Proceedings Vol. 2426:
9th Meeting on Optical Engineering in Israel
Itzhak Shladov; Yitzhak Wiessman; Natan Kopeika, Editor(s)

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