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Proceedings Paper

General methodology for achieving high accuracy in image comparison with application to the analysis of two-dimensional electrophoretic gels
Author(s): Michael M. Skolnick
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Paper Abstract

Abstract not available.

Paper Details

Date Published: 1 January 1990
PDF: 12 pages
Proc. SPIE 1293, Applications of Artificial Intelligence VIII, (1 January 1990); doi: 10.1117/12.21102
Show Author Affiliations
Michael M. Skolnick, Rensselaer Polytechnic Institute (United States)


Published in SPIE Proceedings Vol. 1293:
Applications of Artificial Intelligence VIII
Mohan M. Trivedi, Editor(s)

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