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Proceedings Paper

Patch diameter limits for tiered subaperture SAR image formation algorithms
Author(s): Armin W. Doerry
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Paper Abstract

Synthetic aperture radar image formation algorithms typically use transform techniques that often require trading between image resolution, algorithm efficiency, and focused image scene size limits. This is due to assumptions for the data such as simplified (often straight-line) flight paths, simplified imaging geometry, and simplified models for phase functions. Many errors in such assumptions are typically untreatable due to their dependance on both data domain positions and image domain positions. The result is that large scenes often require inefficient multiple image formation iterations, followed by a mosaicking operation of the focused image patches. One class of image formation algorithms that perform favorably divides the spatial and frequency apertures into subapertures, and perhaps those subapertures into sub- subapertures, and so on, in a tiered subaperture fashion. This allows a gradual shift from data domain into image domain that allows correcting many types of errors that limit other image formation algorithms, even in a dynamic motion environment, thereby allowing large focused image patches without mosaicking. This paper presents and compared focused patch diameter limits for tiered subaperture image formation algorithms, for various numbers of tiers of subapertures. Examples are given that show orders-of-magnitude improvement in non- mosaicked focused image patch size over traditional polar format processing, and that patch size limits increase with the number of tiers of subapertures, although with diminishing returns.

Paper Details

Date Published: 5 June 1995
PDF: 12 pages
Proc. SPIE 2487, Algorithms for Synthetic Aperture Radar Imagery II, (5 June 1995); doi: 10.1117/12.210833
Show Author Affiliations
Armin W. Doerry, Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 2487:
Algorithms for Synthetic Aperture Radar Imagery II
Dominick A. Giglio, Editor(s)

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