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Proceedings Paper

Analysis of errors associated with measurement of projector nonuniformity
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Paper Abstract

This paper addresses the process of measuring the output of individual elements of a pixelized scene projector. The in-band scene projector is a key component of a sensor/seeker test facility such as the Kinetic Kill Vehicle Hardware-in-the-Loop Simulator (KHILS) at Eglin AFB, Florida. Analyses are presented which quantify errors associated with measuring the radiant intensity of individual pixels on a scene projector. The errors are broken down into sampling errors, truncation errors, and random measurement noise. The magnitude of each error source is determined as a function of parameters of the projector and sensor such as the element spacings, and blur. Guidelines for using this information to accurately and efficiently perform nonuniformity correction of a scene projector are presented.

Paper Details

Date Published: 2 June 1995
PDF: 11 pages
Proc. SPIE 2469, Targets and Backgrounds: Characterization and Representation, (2 June 1995); doi: 10.1117/12.210632
Show Author Affiliations
Breck A. Sieglinger, Nichols Research Corp. (United States)
David S. Flynn, Nichols Research Corp. (United States)
Charles F. Coker, Air Force Wright Lab. (United States)


Published in SPIE Proceedings Vol. 2469:
Targets and Backgrounds: Characterization and Representation
Wendell R. Watkins; Dieter Clement, Editor(s)

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