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Proceedings Paper

512x512 cryovacuum resistor infrared scene projector
Author(s): Chien-Jih Han; Barry E. Cole; Robert E. Higashi; Jeff A. Ridley; J. Holmen; Blair Sawyer; Dennis Wagner; Robert G. Stockbridge
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Paper Abstract

A mosaic array of resistively heated microbridges offers flexibility for infra red scene simulations. The array may operate without flicker and display high-intensity dynamic scenes over a wide bandwidth. Honeywell completed fabrication of a 512 X 512 resistor array with 3.5 mils pitch for AEDC's 7V and 10V test chambers. The emitter has a broad bandwidth covering from 2 micrometers to 26 micrometers . The array operates at 20 K to simulate low radiation backgrounds in space. Up to 16,000 pixels may be turned on to simulate targets and target clusters. Each emitter element may heat up to 550 K with 1 kelvin resolution. The maximum power dissipation per pixel is 830 (mu) W for a pixel heated up to 550 K. The maximum power required is 13.2 watts for 16,000 pixels. This low power capability is derived from Honeywell's silicon nitride microbridge structure. Each emitter has approximately 85% fill factor and an average emissivity of 70% over the 2 - 26 micrometers bandwidth. Defect count in the array is less than 1% with one column out. The array may be addressed at 30 frames per second.

Paper Details

Date Published: 2 June 1995
PDF: 11 pages
Proc. SPIE 2469, Targets and Backgrounds: Characterization and Representation, (2 June 1995); doi: 10.1117/12.210586
Show Author Affiliations
Chien-Jih Han, Honeywell Technology Ctr. (United States)
Barry E. Cole, Honeywell Technology Ctr. (United States)
Robert E. Higashi, Honeywell Technology Ctr. (United States)
Jeff A. Ridley, Honeywell Technology Ctr. (United States)
J. Holmen, Honeywell Technology Ctr. (United States)
Blair Sawyer, Mission Research Corp. (United States)
Dennis Wagner, Mission Research Corp. (United States)
Robert G. Stockbridge, Air Force Wright Lab. (United States)


Published in SPIE Proceedings Vol. 2469:
Targets and Backgrounds: Characterization and Representation
Wendell R. Watkins; Dieter Clement, Editor(s)

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