Share Email Print
cover

Proceedings Paper

Specialized focal plane array tests in the focal plane characterization chamber (FPCC)
Author(s): Kimberly D. Mead; Randy A. Nicholson
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The Focal Plane Characterization Chamber (FPCC) at the Arnold Engineering Development Center is configured to provide highly accurate radiometric characterization of focal plane arrays (FPAs). The chamber offers several inherent advantages that render it a unique and highly versatile facility. In addition to the excellent radiometric calibration capability provided by the FPCC, the chamber contains systems to allow several special FPA performance issues to be evaluated. Four of the principal capabilities that have been implemented provide the capability to evaluate performance issues such as crosstalk, FPA response blooming, radiometric flash recovery, and response in various spectral bands. These specialized test capabilities are described and discussed herein.

Paper Details

Date Published: 30 May 1995
PDF: 8 pages
Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); doi: 10.1117/12.210568
Show Author Affiliations
Kimberly D. Mead, Micro Craft Technology (United States)
Randy A. Nicholson, Micro Craft Technology (United States)


Published in SPIE Proceedings Vol. 2474:
Smart Focal Plane Arrays and Focal Plane Array Testing
Marc Wigdor; Mark A. Massie, Editor(s)

© SPIE. Terms of Use
Back to Top