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Proceedings Paper

Low-level gamma dosimetry using low-leakage diodes
Author(s): Larry D. Flesner; Robert K. Creber; Ronald Keith Bentley
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Paper Abstract

Low-leakage silicon p-i-n diodes have been investigated for gamma rate dosimetry. Radiation- induced current response was measured versus gamma flux rate in the range of 107 to 109 gamma-photons/cm2(DOT)s. Energy deposition dose rates inferred from radiation-induced current agree well with expected results based on gamma energy-absorption coefficients. Degradation of diode leakage current due to total dose was also tested.

Paper Details

Date Published: 30 May 1995
PDF: 6 pages
Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); doi: 10.1117/12.210566
Show Author Affiliations
Larry D. Flesner, Naval Command, Control and Ocean Surveillance Ctr. (United States)
Robert K. Creber, Naval Command, Control and Ocean Surveillance Ctr. (United States)
Ronald Keith Bentley, Naval Command, Control and Ocean Surveillance Ctr. (United States)


Published in SPIE Proceedings Vol. 2474:
Smart Focal Plane Arrays and Focal Plane Array Testing
Marc Wigdor; Mark A. Massie, Editor(s)

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