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Proceedings Paper

Development of a focal plane array data system for component-level characterization and real-time mission simulation testing
Author(s): R. H. Fugerer; D. J. Hervig; Lanny L. Holt; Calvin R. Banks; D. I. Jennings; T. J. Worley
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Paper Abstract

This paper will describe the USAF Arnold Engineering Development Center (AEDC) technology efforts that provide signal processing and data system support for infrared (IR) Focal Plane Array (FPA) testing. The requirements for AEDC space sensor testing range from component-level FPA characterization to advanced mission simulation. The technology efforts underway address these requirements by developing hardware and software that meet AEDC's generic needs for FPA testing. Component-level FPA characterization places unique requirements on system fidelity and bandwidth performance. Diversity in sensor types being tested and levels of sensor integration creates the need for versatility in data handling and sensor interfaces. Mission simulation requirements emphasize the need for extended data storage, system throughput, and data display capabilities. A signal processing system will be presented which addresses AEDC's requirements for component-level sensor operation, data acquisition, and flexible interface architectures that can be modified quickly to accommodate different sensor interfaces and data formats. The system will also address the need for high- speed storage of very large data arrays during mission simulation testing. Techniques used to verify and validate system operation will also be presented.

Paper Details

Date Published: 30 May 1995
PDF: 10 pages
Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); doi: 10.1117/12.210565
Show Author Affiliations
R. H. Fugerer, Micro Craft Technology (United States)
D. J. Hervig, Micro Craft Technology (United States)
Lanny L. Holt, Micro Craft Technology (United States)
Calvin R. Banks, Micro Craft Technology (United States)
D. I. Jennings, Micro Craft Technology (United States)
T. J. Worley, Micro Craft Technology (United States)


Published in SPIE Proceedings Vol. 2474:
Smart Focal Plane Arrays and Focal Plane Array Testing
Marc Wigdor; Mark A. Massie, Editor(s)

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