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Proceedings Paper

Test methodologies for linear longwave infrared detector array production
Author(s): Samuel C. H. Wang; Gregg K. Dudoff; John Roussis; John M. Swab; Michael L. Winn; Steven R. Jost
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Paper Abstract

We describe in this paper a flow process that details design, fabrication, and test methodologies for the production of linear longwave infrared (LWIR) HgCdTe (MCT) detector arrays. The modular manufacturing approach emphasizes testability in the component design and zero-loss procedure in the FPA assembly that achieved reliable, low-cost production of high performance scanning LWIR focal plane arrays. In-depth theory, practice, and automation of infrared detector array evaluation are also discussed.

Paper Details

Date Published: 30 May 1995
PDF: 12 pages
Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); doi: 10.1117/12.210563
Show Author Affiliations
Samuel C. H. Wang, Martin Marietta Labs. (United States)
Gregg K. Dudoff, Martin Marietta Labs. (United States)
John Roussis, Martin Marietta Labs. (United States)
John M. Swab, Martin Marietta Labs. (United States)
Michael L. Winn, Martin Marietta Labs. (United States)
Steven R. Jost, Martin Marietta Labs. (United States)


Published in SPIE Proceedings Vol. 2474:
Smart Focal Plane Arrays and Focal Plane Array Testing
Marc Wigdor; Mark A. Massie, Editor(s)

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