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Proceedings Paper

Equipment and process improvements in a second-generation technology test facility
Author(s): Duane A. Estrada; Mary J. Hewitt; Bruce Krashefski
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Paper Abstract

Second-generation technology production and development testing must be performed by equipment and processes that are capable of handling the tasks in an economically efficient manner. As such, data acquisition and reduction times, configuration change complexity, and test set recurring costs must be kept at a minimum to meet the needs of the second-generation IR factory. The maximum test throughput must be achieved, while meeting all technical requirements, using a minimum of program or capital assets. SBRC's method to accomplish this includes the design of the next generation of infrared test station, with a defined interface architecture, that allows great flexibility in the use of optical tables, warm and cryoprobers, and other test equipment. The paper will present a comparison of relative cost and capability between this most recent generation of test stations and the past generations. Benchmarks of key data acquisition and reduction speeds will be discussed. Also, benchmarks of configuration change time and performance may be included. The design of the interface architecture that allows flexible use of all supplemental test equipment (such as optical tables) is addressed. A general comparison of pre- and post-test equipment changes, as they relate to test throughput on a macro level, is included. There will also be a discussion of the increased capabilities of IR development and production test at this facility.

Paper Details

Date Published: 30 May 1995
PDF: 7 pages
Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); doi: 10.1117/12.210562
Show Author Affiliations
Duane A. Estrada, Santa Barbara Research Ctr. (United States)
Mary J. Hewitt, Santa Barbara Research Ctr. (United States)
Bruce Krashefski, Santa Barbara Research Ctr. (United States)


Published in SPIE Proceedings Vol. 2474:
Smart Focal Plane Arrays and Focal Plane Array Testing
Marc Wigdor; Mark A. Massie, Editor(s)

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