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Proceedings Paper

Modular approach to focal plane array testing
Author(s): Walter V. Wilinsky
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Paper Abstract

A low cost, PC based Infrared Focal Plane Array (FPA) test station has been designed and implemented utilizing state of the art analog to digital converters, a digital signal processor, and Windows based software. A modular design allows for ease of upgrades. New A/D's, additional memory, or state of the art digital signal processors can be implemented without making major changes to system hardware or software. The software accommodates all of the various scanning and staring arrays made at Texas Instruments. The modular design of the software minimizes major rewrites when new FPA configurations are encountered. The overall laboratory test dewar (FPAs must be cooled to cryogenic temperatures for operation and testing) based testing philosophy has also been modified. In order to facilitate a low noise design a lab dewar that simulates a tactical dewar (the final IR system integrated cooling package) with side boards has been used. These `side boards' eliminate any unnecessary cabling to and from external hardware, thereby reducing pick-up noise. The test station's noise floor routinely approaches the theoretical RMS noise limit for the various A/D's being used (16 bit 2 MHz and 14 bit Mhz).

Paper Details

Date Published: 30 May 1995
PDF: 11 pages
Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); doi: 10.1117/12.210560
Show Author Affiliations
Walter V. Wilinsky, Texas Instruments Inc. (United States)


Published in SPIE Proceedings Vol. 2474:
Smart Focal Plane Arrays and Focal Plane Array Testing
Marc Wigdor; Mark A. Massie, Editor(s)

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